By Peter W. Hawkes
Advances in Imaging & Electron Physics merges long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The sequence positive factors prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, picture technology and electronic photo processing, electromagnetic wave propagation, electron microscopy, and the computing equipment utilized in some of these domains.
- Contributions from top professionals
- Informs and updates on the entire most recent advancements within the field
Read Online or Download Advances in Imaging and Electron Physics, Volume 186 PDF
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Extra info for Advances in Imaging and Electron Physics, Volume 186
If needed, the focus and stigmator 28 Niels de Jonge et al. 14 STEM imaging of gold-labeled (10-nm diameter) EGFRs in COS7 cells in a wet environment. The beam energy was 200 keV. (a) Image of a region of a cell, showing the cell in lighter gray tones against a darker, uniform background. At this magniﬁcation, only clusters of gold labels are visible. (b) Image recorded at the position of the dashed rectangle in (a) at a higher magniﬁcation, where labels become visible. (c) The gold labels are visible as individual particles.
B) Open tip showing the slot with alignment poles and a small O-ring. (c-d) Grabbing a microchip with a ﬂat-beaked tweezer. (e) The slot with the stack of two microchips loaded. (f) Closing the lid. (g) The closed tip. membrane facing upward, and a droplet of liquid (for example, 10% PBS in water) is pipetted on the window. Glycerol can be added to increase the viscosity and delay evaporation. Preferably within a minute, a microchip with ﬁxed and wet cells is loaded with the cells facing down.
In situ transmission electron microscopy of lead dendrites and lead ions in aqueous solution. ACS Nano, 6, 6308–6317. Williamson, M. , Tromp, R. , Vereecken, P. , & Ross, F. M. (2003). Dynamic microscopy of nanoscale cluster growth at the solid-liquid interface. Nature Materials, 2, 532–536. Woehl, T. , Jungjohann, K. , Evans, J. , Ristenpart, W. , & Browning, N. D. (2013). Experimental procedures to mitigate electron beam–induced artifacts during in situ ﬂuid imaging of nanomaterials. Ultramicroscopy, 127, 53–63.
Advances in Imaging and Electron Physics, Volume 186 by Peter W. Hawkes